April 26, 2004--The new web interface at http://www.icyield.com gives designers an opportunity to explore the use of critical area analysis to determine the yield of their designs. The critical area maps generated by the service highlight those parts of the layout where defects are most likely to cause faults. The maps also give graphical feedback to the designer to help them understand where layout changes can be made and why these changes have improved the design yield.

Gerard Allan of Predictions Software said "The web interface to our peye-caa tool will introduce designers of standard and custom cells to the new world of "design for yield" giving them access to the information they need to optimize their cell designs for high yield. Having design for yield in at the library cell level leverages the yield of every chip that uses the library.".


Further information on PEYE-CAA and Predictions Software is available from:

Gerard Allan,
Predictions Software Ltd
Edinburgh Technology Transfer Centre
The Kings Buildings
Mayfield Road
Edinburgh, EH9 3JL
United Kingdom

Gerard.Allan@icyield.com
Tel +44 131 472 4725.
http://www.icyield.com





This article courtesy of The Rugs Directory .
You may freely reprint this article on your website or in
your newsletter provided this courtesy notice and the author
name and URL remain intact.